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Yoshi OHNO
National Institute of Standards and Technology (NIST) Fellow; Former President of International Commission on Illumination (CIE)

Yoshi Ohno is actively involved in research pertaining to photometry and colorimetry. Specific projects of interest include integrating sphere, luminous flux measurement, colorimetry of light sources, color rendering, spectroradiometry, photometry of flashing lights, and solid state lighting. He is a Fellow of IESNA, former President of International Commission on Illumination (CIE), NIST representative for CCPR, Chair of CCPR Working Group of Key Comparisons, and active in technical committees in CIE, ISO, ANSI, and IESNA.